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» On applying non-classical defect models to automated diagnos...
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ITC
1998
IEEE
117views Hardware» more  ITC 1998»
13 years 9 months ago
On applying non-classical defect models to automated diagnosis
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
Jayashree Saxena, Kenneth M. Butler, Hari Balachan...
ESWA
2008
151views more  ESWA 2008»
13 years 4 months ago
Automated diagnosis of sewer pipe defects based on machine learning approaches
In sewage rehabilitation planning, closed circuit television (CCTV) systems are the widely used inspection tools in assessing sewage structural conditions for non man entry pipes....
Ming-Der Yang, Tung-Ching Su
DAC
2000
ACM
14 years 5 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
13 years 10 months ago
Fault Pattern Oriented Defect Diagnosis for Memories
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung...
ITC
1998
IEEE
94views Hardware» more  ITC 1998»
13 years 9 months ago
Probabilistic mixed-model fault diagnosis
Previously-proposed strategies for VLSI fault diagnosis have su ered from a variety of self-imposed limitations. Some techniques are limited to a speci c fault model, and many wil...
David B. Lavo, Brian Chess, Tracy Larrabee, Ismed ...