301 search results - page 1 / 61 » On bounding the delay of a critical path |
DAC
2000
ACM
14 years 5 months ago
2000
ACM
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
ICCAD
2008
IEEE
13 years 11 months ago
2008
IEEE
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...