14 search results - page 3 / 3 » On reducing both shift and capture power for scan-based test... |
DFT
2005
IEEE
13 years 8 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
CVPR
2009
IEEE
15 years 1 months ago
2009
IEEE
We introduce a new technique that can reduce any
higher-order Markov random field with binary labels into
a first-order one that has the same minima as the original.
Moreover, w...
ECCV
2006
Springer
14 years 8 months ago
2006
Springer
Recently, the wide deployment of practical face recognition systems gives rise to the emergence of the inter-modality face recognition problem. In this problem, the face images in ...
ICASSP
2011
IEEE
12 years 10 months ago
2011
IEEE
We present a robust method to map detected facial Action Units (AUs) to six basic emotions. Automatic AU recognition is prone to errors due to illumination, tracking failures and ...