96 search results - page 18 / 20 » On test coverage of path delay faults |
DAC
2006
ACM
13 years 7 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
EURODAC
1994
IEEE
13 years 10 months ago
1994
IEEE
The paper presents a synthesis approach for pipelinelike controller structures. These structures allow to implement a built-in self-test in two sessions without any extra test reg...
ICCAD
1999
IEEE
13 years 10 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...