19 search results - page 1 / 4 » On test generation by input cube avoidance |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
ISSTA
2006
ACM
13 years 10 months ago
2006
ACM
The popularity of object-oriented programming has led to the wide use of container libraries. It is important for the reliability of these containers that they are tested adequate...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
COR
2008
13 years 4 months ago
2008
This paper presents a tabu search metaheuristic algorithm for the automatic generation of structural software tests. It is a novel work since tabu search is applied to the automat...
ASWEC
2007
IEEE
13 years 8 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...