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ITC
2003
IEEE

Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk

13 years 9 months ago
Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of a domino gate in the presence of crosstalk is developed and exploited by a new efficient timing analysis algorithm. The algorithm uses a single, breadth-first traversal to compute delays in the presence of crosstalk. Thus, it avoids the iterative methods commonly employed for static CMOS circuits. The timing analysis technique is used to generate test input vectors that exercise the worst-case delays of a multiplier circuit implemented using domino logic. Hspice simulation results demonstrate that the technique identifies test vectors that produce circuit delay that satisfy the targeted value in the presence of crosstalk.
Rahul Kundu, R. D. (Shawn) Blanton
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors Rahul Kundu, R. D. (Shawn) Blanton
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