7 search results - page 2 / 2 » On test generation for transition faults with minimized peak... |
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...