66 search results - page 1 / 14 » On the Modeling and Analysis of Jitter in ATE Using Matlab |
DFT
2005
IEEE
13 years 11 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
DFT
2005
IEEE
13 years 11 months ago
2005
IEEE
A new jitter model is developed using Matlab and Spice to analyze Data Dependent Jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent...
TII
2008
13 years 5 months ago
2008
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
ICASSP
2009
IEEE
14 years 6 days ago
2009
IEEE
Sampling error due to jitter, or noise in the sample times, affects the precision of analog-to-digital converters in a significant, nonlinear fashion. In this paper, a polynomial...