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INFOCOM
2010
IEEE
13 years 4 months ago
Scalable NIDS via Negative Pattern Matching and Exclusive Pattern Matching
i In this paper, we identify the unique challenges in deploying parallelism on TCAM-based pattern matching for Network Intrusion Detection Systems (NIDSes). We resolve two critica...
Kai Zheng, Xin Zhang, Zhiping Cai, Zhijun Wang, Ba...
INFOCOM
2010
IEEE
13 years 4 months ago
Routing and Scheduling for Energy and Delay Minimization in the Powerdown Model
—Energy conservation is drawing increasing attention in data networking. One school of thought believes that a dominant amount of energy saving comes from turning off network ele...
Matthew Andrews, Antonio Fernández, Lisa Zh...
ASPDAC
2010
ACM
637views Hardware» more  ASPDAC 2010»
13 years 4 months ago
A new graph-theoretic, multi-objective layout decomposition framework for double patterning lithography
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
Jae-Seok Yang, Katrina Lu, Minsik Cho, Kun Yuan, D...
TOMACS
2011
139views more  TOMACS 2011»
13 years 29 days ago
The double CFTP method
We consider the problem of the exact simulation of random variables Z that satisfy the distributional identity Z L = V Y + (1 − V )Z, where V ∈ [0, 1] and Y are independent, an...
Luc Devroye, Lancelot F. James
TCAD
2010
136views more  TCAD 2010»
13 years 23 days ago
Bounded Model Debugging
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
Brian Keng, Sean Safarpour, Andreas G. Veneris