Detection of defective pixels that develop on-line is a vital part of fault tolerant schemes for repairing imagers during operation. This paper presents a new algorithm for the id...
Glenn H. Chapman, Israel Koren, Zahava Koren, Jozs...
Event identification in photon counting ICCD detectors requires a high level image analysis which cannot be easily described algorithmically: neural networks are promising to appr...
Monica Alderighi, E. L. Gummati, Vincenzo Piuri, G...