3 search results - page 1 / 1 » On-the-Fly Reseeding: A New Reseeding Technique for Test-Per... |
ET
2002
13 years 4 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
ICCD
2002
IEEE
14 years 1 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...