170 search results - page 2 / 34 » Online BIST for Embedded Systems |
ITC
1996
IEEE
13 years 10 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
MTDT
2003
IEEE
13 years 11 months ago
2003
IEEE
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
ITC
1996
IEEE
13 years 10 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
DFT
2003
IEEE
13 years 11 months ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
WISES
2003
13 years 7 months ago
2003
— With the increasing number of embedded computer systems being used in safety critical applications the testing and assessment of a system’s fault tolerance properties become ...