67 search results - page 2 / 14 » Online circuit reliability monitoring |
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
GLVLSI
2010
IEEE
13 years 10 months ago
2010
IEEE
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
VTS
1995
IEEE
13 years 8 months ago
1995
IEEE
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in proce...
SIGSOFT
2008
ACM
13 years 5 months ago
2008
ACM
If an organization depends on the service quality provided by another organization it often enters into a bilateral service level agreement (SLA), which mitigates outsourcing risk...
TIME
2005
IEEE
13 years 10 months ago
2005
IEEE
Abstract— We present a specification language and algorithms for the online and offline monitoring of synchronous systems including circuits and embedded systems. Such monitori...