166 search results - page 2 / 34 » Optimal System-on-Chip Test Scheduling |
VLSI
2005
Springer
13 years 11 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
ICCAD
1999
IEEE
13 years 9 months ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
ECRTS
2009
IEEE
13 years 3 months ago
2009
IEEE
A recent result in [13] has demonstrated the existence of a sufficient global EDF schedulability test for sporadic task systems that makes the following guarantee: any task system...
RTS
2011
12 years 8 months ago
2011
This paper is an extended version of a paper that appeared in the proceedings of the IEEE Real-Time Systems Symposium 2009. This paper has been updated with respect to advances ma...