48 search results - page 1 / 10 » Orthogonal Scan: Low-Overhead Scan for Data Paths |
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
IPMI
1999
Springer
13 years 8 months ago
1999
Springer
Three dimensional models of anatomical structures are currently used to aid in medical diagnosis, treatment, surgical guidance, and surgical simulation. Limitations on the resolut...
INFOCOM
2011
IEEE
12 years 8 months ago
2011
IEEE
—We explore distributed mechanisms for maintaining the physical layer connectivity of a mobile wireless network while still permitting significant area coverage. Moreover, we re...
DATE
1997
IEEE
13 years 8 months ago
1997
IEEE
This paper presents a testability analysis and improvement technique for the controller of an RT level design. It detects hard-to-reachstates by analyzing both the data path and t...