38 search results - page 2 / 8 » PKorat: Parallel Generation of Structurally Complex Test Inp... |
COR
2008
13 years 4 months ago
2008
This paper presents a tabu search metaheuristic algorithm for the automatic generation of structural software tests. It is a novel work since tabu search is applied to the automat...
VTS
1995
IEEE
13 years 8 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
ET
2000
13 years 4 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
FMICS
2008
Springer
13 years 6 months ago
2008
Springer
Lustre is a formal synchronous declarative language widely used for modeling and specifying safety-critical applications in the elds of avionics, transportation or energy productio...