257 search results - page 2 / 52 » Packet-Based Input Test Data Compression Techniques |
TVLSI
2010
13 years 3 days ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ICCAD
2007
IEEE
13 years 9 months ago
2007
IEEE
Abstract-- In this paper, we propose a novel test data compression technique named CacheCompress, which combines selective encoding and dynamic dictionary based encoding. Depending...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
ICCD
2003
IEEE
14 years 2 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...