12 search results - page 1 / 3 » Parallel Genetic Algorithms for Simulation-Based Sequential ... |
VLSID
1997
IEEE
13 years 9 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
VLSID
1993
IEEE
13 years 8 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
ITC
1994
IEEE
13 years 8 months ago
1994
IEEE
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
IPPS
1998
IEEE
13 years 9 months ago
1998
IEEE
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...