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1998
IEEE

Meta-heuristics for Circuit Partitioning in Parallel Test Generation

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Meta-heuristics for Circuit Partitioning in Parallel Test Generation
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biology, respectively, and are the most popular meta-heuristics or general-purpose optimization strategies. A hybrid algorithm for circuit partitioning, which uses tabu search to improve the simulated annealing meta-heuristics, is also proposed and compared with pure tabu search and simulated annealing algorithms, and also with a genetic algorithm. The solutions obtained are compared and evaluated by including the hybrid partitioning algorithm in a parallel test generator which is used to determine the test patterns for the circuits of the frequently used ISCAS benchmark set.
Consolación Gil, Julio Ortega, Antonio F. D
Added 05 Aug 2010
Updated 05 Aug 2010
Type Conference
Year 1998
Where IPPS
Authors Consolación Gil, Julio Ortega, Antonio F. Díaz, Maria Dolores Gil Montoya
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