Testing is inherently incomplete; no test suite will ever be able to test all possible usage scenarios of a system. It is therefore vital to assess the implication of a system pas...
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
Alex Shye, Tipp Moseley, Vijay Janapa Reddi, Josep...
After having drawn up a state of the art on the theoretical feasibility of a system of periodic tasks scheduled by a preemptive algorithm at fixed priorities, we show in this art...
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...