5 search results - page 1 / 1 » Parametric Fault Diagnosis of Nonlinear Analog Circuits Usin... |
VLSID
2010
IEEE
13 years 8 months ago
2010
IEEE
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
ICCBR
2003
Springer
13 years 10 months ago
2003
Springer
Abstract. There have been some Artificial Intelligence applications developed for electronic circuits diagnosis, but much remains to be done in this field, above all in the analo...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
DAC
1996
ACM
13 years 9 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...