11 search results - page 1 / 3 » Partial Scan Using Multi-Hop State Reachability Analysis |
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
ASPDAC
1995
ACM
13 years 8 months ago
1995
ACM
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
PSTV
1992
13 years 6 months ago
1992
We study the effect of three new reduction strategies for conventional reachability analysis, as used in automated protocol validation algorithms. The first two strategies are imp...
DATE
1997
IEEE
13 years 9 months ago
1997
IEEE
This paper presents a testability analysis and improvement technique for the controller of an RT level design. It detects hard-to-reachstates by analyzing both the data path and t...
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATPG performance while keeping acceptable area and performance overheads. Several ...