3 search results - page 1 / 1 » Path-RO: a novel on-chip critical path delay measurement und... |
ICCAD
2008
IEEE
13 years 11 months ago
2008
IEEE
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
ASPDAC
2012
ACM
12 years 12 days ago
2012
ACM
With technology scaling, integrated circuits behave more unpredictably due to process variation, environmental changes and aging effects. Various variation-aware and adaptive desi...