114 search results - page 21 / 23 » Path-based fault correlations |
ISESE
2006
IEEE
13 years 12 months ago
2006
IEEE
Effective testing of safety-critical real-time embedded software is difficult and expensive. Many companies are hesitant about the cost of formalized criteria-based testing and a...
ASIACRYPT
2005
Springer
13 years 11 months ago
2005
Springer
In this paper we revisit a known but ignored weakness of the RC4 keystream generator, where secret state info leaks to the generated keystream, and show that this leakage, also kno...
VLSID
2006
IEEE
13 years 11 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2001
ACM
14 years 6 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...