35 search results - page 7 / 7 » Pattern generation for a deterministic BIST scheme |
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
TCBB
2008
13 years 5 months ago
2008
It is a consensus in microarray analysis that identifying potential local patterns, characterized by coherent groups of genes and conditions, may shed light on the discovery of pre...
EUROCAST
1997
Springer
13 years 9 months ago
1997
Springer
The ability to detect object size, location and movement is essential for a visual system in either a biological or man made environment. In this paper we present a model for esti...