64 search results - page 2 / 13 » Penetration Testing with Improved Input Vector Identificatio... |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...