33 search results - page 7 / 7 » Performance of Graceful Degradation for Cache Faults |
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
TC
2011
12 years 11 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...
ASAP
2008
IEEE
13 years 11 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...