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VLSID
1997
IEEE
112views VLSI» more  VLSID 1997»
13 years 10 months ago
Adder and Comparator Synthesis with Exclusive-OR Transform of Inputs
An exclusive-OR transform of input variables significantly reduces the size of the PLA implementation for adder and comparator circuits. For n bit adder circuits, the size of PLA ...
James Jacob, P. Srinivas Sivakumar, Vishwani D. Ag...
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
13 years 11 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov
VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 6 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
GLVLSI
2006
IEEE
185views VLSI» more  GLVLSI 2006»
13 years 11 months ago
Application of fast SOCP based statistical sizing in the microprocessor design flow
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...
Murari Mani, Mahesh Sharma, Michael Orshansky
ICCAD
2005
IEEE
97views Hardware» more  ICCAD 2005»
14 years 2 months ago
DiCER: distributed and cost-effective redundancy for variation tolerance
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...
Di Wu, Ganesh Venkataraman, Jiang Hu, Quiyang Li, ...