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TCAD
2011
13 years 7 days ago
Low-Power Clock Tree Design for Pre-Bond Testing of 3-D Stacked ICs
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
Xin Zhao, Dean L. Lewis, Hsien-Hsin S. Lee, Sung K...
DATE
2008
IEEE
111views Hardware» more  DATE 2008»
13 years 11 months ago
Power-Aware Testing and Test Strategies for Low Power Devices
Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, ...
VLSID
2004
IEEE
93views VLSI» more  VLSID 2004»
14 years 5 months ago
Random Access Scan: A solution to test power, test data volume and test time
Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara
ICASSP
2011
IEEE
12 years 9 months ago
A perceptually transparent audio power reduction algorithm for loudspeaker power management
Power management in loudspeakers is used to extend the battery life of portable electronics and to prevent thermal damage to the speakers. Traditionally, speaker power management ...
Leung Kin Chiu, Nathan V. Parrish, David V. Anders...