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GLVLSI
2010
IEEE
190views VLSI» more  GLVLSI 2010»
13 years 7 months ago
A linear statistical analysis for full-chip leakage power with spatial correlation
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong
DAC
2003
ACM
14 years 6 months ago
Random walks in a supply network
This paper presents a power grid analyzer based on a random walk technique. A linear-time algorithm is first demonstrated for DC analysis, and is then extended to perform transien...
Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar
VTS
2000
IEEE
114views Hardware» more  VTS 2000»
13 years 9 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic