33 search results - page 4 / 7 » Power calculation and modeling in deep submicron |
ISQED
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
DAC
2002
ACM
14 years 7 months ago
2002
ACM
Reducing power dissipation is one of the most principle subjects in VLSI design today. Scaling causes subthreshold leakage currents to become a large component of total power diss...
IOLTS
2003
IEEE
13 years 11 months ago
2003
IEEE
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
PATMOS
2004
Springer
13 years 11 months ago
2004
Springer
Abstract. Crosstalk causes logical errors due to data dependent delay degradation as well as energy consumption and is considered the biggest signal integrity challenge for long on...
DATE
2002
IEEE
13 years 11 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...