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ISQED
2010
IEEE

Leakage temperature dependency modeling in system level analysis

10 years 2 months ago
Leakage temperature dependency modeling in system level analysis
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical in power-aware and thermal-aware design for electronic systems. Previous circuit-level research results can capture the leakage/temperature dependency accurately, but can be too complex and thus ineffective in high level system design. In this paper, we study a large spectrum of leakage power models that are able to account for the leakage/temperature dependency, and in the meantime, are simple enough and suitable for system level design. We analyze and compare the tradeoff between the complexity and accuracy of these models empirically. Our experimental results strengthen the important role that the leakage power consumption plays in the electronic system design as the transistor size continues to shrink. More importantly, our results highlight the fact that it is vital to take the leakage/temperature and l...
Huang Huang, Gang Quan, Jeffrey Fan
Added 17 May 2010
Updated 17 May 2010
Type Conference
Year 2010
Where ISQED
Authors Huang Huang, Gang Quan, Jeffrey Fan
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