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» Prediction of Power Requirements for High-Speed Circuits
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DATE
2010
IEEE
132views Hardware» more  DATE 2010»
13 years 10 months ago
Programmable aging sensor for automotive safety-critical applications
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...
Julio César Vázquez, Víctor H...
HPCA
2003
IEEE
14 years 5 months ago
Control Techniques to Eliminate Voltage Emergencies in High Performance Processors
Increasing focus on power dissipation issues in current microprocessors has led to a host of proposals for clock gating and other power-saving techniques. While generally effectiv...
Russ Joseph, David Brooks, Margaret Martonosi
VLSID
2006
IEEE
183views VLSI» more  VLSID 2006»
13 years 11 months ago
Design Challenges for High Performance Nano-Technology
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
Goutam Debnath, Paul J. Thadikaran
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
13 years 11 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
MICRO
2005
IEEE
114views Hardware» more  MICRO 2005»
13 years 11 months ago
Address-Indexed Memory Disambiguation and Store-to-Load Forwarding
This paper describes a scalable, low-complexity alternative to the conventional load/store queue (LSQ) for superscalar processors that execute load and store instructions speculat...
Sam S. Stone, Kevin M. Woley, Matthew I. Frank