23 search results - page 1 / 5 » Processor-programmable memory BIST for bus-connected embedde... |
ASPDAC
2001
ACM
13 years 8 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
INTEGRATION
1998
13 years 4 months ago
1998
An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-provide...
MTDT
2003
IEEE
13 years 10 months ago
2003
IEEE
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
VLSID
2001
IEEE
14 years 5 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ASPDAC
2000
ACM
13 years 8 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...