23 search results - page 5 / 5 » Processor-programmable memory BIST for bus-connected embedde... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
ATS
2001
IEEE
13 years 9 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...