208 search results - page 40 / 42 » Programmer-based fault prediction |
ETS
2006
IEEE
14 years 3 days ago
2006
IEEE
- The resources available on a chip continue to grow, following Moore's Law. However, the major process by which the benefits of Moore's Law accrue, which is the continui...
DAC
2007
ACM
14 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
SIGSOFT
2007
ACM
14 years 6 months ago
2007
ACM
Automatic bug-finding tools have a high false positive rate: most warnings do not indicate real bugs. Usually bug-finding tools assign important warnings high priority. However, t...
ICDCSW
2009
IEEE
14 years 21 days ago
2009
IEEE
Embedded wireless networks have largely focused on openloop sensing and monitoring. To address actuation in closedloop wireless control systems there is a strong need to re-think ...
ISCA
2009
IEEE
14 years 21 days ago
2009
IEEE
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...