69 search results - page 1 / 14 » Protected IP-core test generation |
SBCCI
2005
ACM
13 years 10 months ago
2005
ACM
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
ICTAI
2000
IEEE
13 years 9 months ago
2000
IEEE
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
DELTA
2004
IEEE
13 years 8 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...