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TVLSI
2010
12 years 11 months ago
Variation-Aware System-Level Power Analysis
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
Saumya Chandra, Kanishka Lahiri, Anand Raghunathan...
CBMS
2004
IEEE
13 years 8 months ago
Online Medical Teaching Case Database
Page >> Table of Contents >> Abstract 17th IEEE Symposium on Computer-Based Medical Systems (CBMS'04) p. 420 Online Medical Teaching Case Database Susan Kansagra, ...
Susan Kansagra, Chris Chang, Saleem Hussain, Grego...
ICTAC
2010
Springer
13 years 3 months ago
Preference and Non-deterministic Choice
Material Flow Abstraction of Manufacturing Systems. ‣Umberto Costa, Ivan de Medeiros Jr and Marcel Oliveira. Specification and Verification of a MPI Implementation for a MP-SoC...
Bill Stoddart, Frank Zeyda, Steve Dunne