Search Sciweavers | Sciweavers

864 search results - page 1 / 173

» Questions in, knowledge in

click to vote

ITC
2003
IEEE

129views Hardware» more ITC 2003»

Relating Yield Models to Burn-In Fall-Out in Time

13 years 9 months ago

Download www.itcprogramdev.org

An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...

Thomas S. Barnett, Adit D. Singh

claim paper

Read More »

click to vote

AAAI
2008

104views Intelligent Agents» more AAAI 2008»

Question Utility: A Novel Static Ranking of Question Search

13 years 7 months ago

Download www.aaai.org

Young-In Song, Chin-Yew Lin, Yunbo Cao, Hae-Chang ...

claim paper

Read More »

click to vote

AAAI
2007

95views Intelligent Agents» more AAAI 2007»

Supporting Feedback and Assessment of Digital Ink Answers to In-Class Exercises

13 years 7 months ago

Download projects.csail.mit.edu

Effective teaching involves treating the presentation of new material and the assessment of students’ mastery of this material as part of a seamless and continuous feedback cycl...

Kimberle Koile, Kevin Chevalier, Michel Rbeiz, Ada...

claim paper

Read More »

click to vote

AIRS
2005
Springer

91views Information Technology» more AIRS 2005»

Phrase-Based Definitional Question Answering Using Definition Terminology

13 years 10 months ago

Download nlp.korea.ac.kr

Kyoung-Soo Han, Young-In Song, Sang-Bum Kim, Hae-C...

claim paper

Read More »