7 search results - page 1 / 2 » RF Testing on a Mixed Signal Tester |
ET
2007
13 years 4 months ago
2007
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global posit...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
VTS
2006
IEEE
13 years 10 months ago
2006
IEEE
Abstract— Numerous machine-learning-based test methodologies have been proposed in recent years as a fast alternative to the standard functional testing of mixed-signal/RF integr...