8 search results - page 1 / 2 » RT-Level ITC'99 Benchmarks and First ATPG Results |
DT
2000
13 years 4 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-leve...
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
ICCAD
2002
IEEE
14 years 1 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
DDECS
2008
IEEE
13 years 11 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...