7 search results - page 2 / 2 » RTL Test Pattern Generation for High Quality Loosely Determi... |
IOLTS
2000
IEEE
13 years 10 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
DAC
1999
ACM
13 years 10 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...