common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the ...
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...