2 search results - page 1 / 1 » Recent Advances in Test Planning for Modular Testing of Core... |
ATS
2002
IEEE
13 years 10 months ago
2002
IEEE
Test planning for core-based system-on-a-chip (SOC) designs is necessary to reduce testing time and test cost. In this paper, we survey recent advances in test planning that addre...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Multi-level TAM optimization is necessary for modular testing of hierarchical SOCs that contain older-generation SOCs as embedded cores. We present two hierarchical TAM optimizati...