201 search results - page 2 / 41 » Reducing Test Application Time Through Test Data Mutation En... |
TVLSI
2008
13 years 5 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
DAC
2003
ACM
13 years 10 months ago
2003
ACM
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
SERP
2007
13 years 6 months ago
2007
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...