9 search results - page 2 / 2 » Reducing pin and area overhead in fault-tolerant FPGA-based ... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
ISQED
2010
IEEE
13 years 10 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
VTC
2010
IEEE
13 years 3 months ago
2010
IEEE
—Vehicular Ad-hoc NETworks (VANETs) adopting Dedicated Short-Range Communications (DSRCs) have emerged as a preferred choice of network design for the Intelligent Transportation ...