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APCSAC
2005
IEEE
13 years 10 months ago
Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
Jie Hu, Greg M. Link, Johnsy K. John, Shuai Wang, ...
IEEEPACT
2008
IEEE
13 years 11 months ago
Skewed redundancy
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
Gordon B. Bell, Mikko H. Lipasti
EDCC
2006
Springer
13 years 8 months ago
SEU Mitigation Techniques for Microprocessor Control Logic
The importance of fault tolerance at the processor architecture level has been made increasingly important due to rapid advancements in the design and usage of high performance de...
T. S. Ganesh, Viswanathan Subramanian, Arun K. Som...
DSN
2007
IEEE
13 years 11 months ago
BlackJack: Hard Error Detection with Redundant Threads on SMT
Testing is a difficult process that becomes more difficult with scaling. With smaller and faster devices, tolerance for errors shrinks and devices may act correctly under certain ...
Ethan Schuchman, T. N. Vijaykumar
DSN
2002
IEEE
13 years 9 months ago
Ditto Processor
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
Shih-Chang Lai, Shih-Lien Lu, Jih-Kwon Peir