69 search results - page 1 / 14 » Reducing the Complexity of Defect Level Modeling Using the C... |
DATE
2000
IEEE
13 years 10 months ago
2000
IEEE
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
ICPP
2009
IEEE
14 years 5 days ago
2009
IEEE
—In an attempt to increase the performance/cost ratio, large compute clusters are becoming heterogeneous at multiple levels: from asymmetric processors, to different system archi...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ICSE
2008
IEEE-ACM
14 years 6 months ago
2008
IEEE-ACM
In software development, resources for quality assurance are limited by time and by cost. In order to allocate resources effectively, managers need to rely on their experience bac...