Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method

Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.

• Type: Conference
• Year: 2003
• Where: ATS
• Authors: Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer
• Keywords: ATS 2003, Hardware, Test Generation, Test Generation Approaches, Test Pattern