70 search results - page 1 / 14 » Relating Yield Models to Burn-In Fall-Out in Time |
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
WSC
1998
1998
Effective Implementation of Cycle Time Reduction Strategies for Semiconductor Back-end Manufacturing
13 years 5 months ago
Using discrete-event simulation models, a study was conducted to evaluate the current production practices of a high-volume semiconductor back-end operation. The overall goal was ...
MSOM
2010
12 years 11 months ago
2010
The Vaccine and Related Biologic Products Advisory Committee meets at least once a year to decide the composition of the influenza vaccine in the U.S. Past evidence suggests that ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
ENVSOFT
2008
13 years 4 months ago
2008
In this study we investigated the perspective offered by coupling a simple vegetation growth model and ground-based remotely-sensed data for the monitoring of wheat production. A ...